PSS Partners
PSS has teamed up with three innovative companies who provide unique analytical instruments and techniques. Their complimentary techniques allow the user to not only size particles but determine shape and other morphological properties, quantify foaming, and measure surface tension and surface area. Be sure to check out our partners. They may have the solution to your particle problem.
What’s Happening?
January
Dr. David Nicoli presents poster on EXCITING NEW FX-Nano Technology and Protein Aggregation at PEPTALK in San Diego.
February
PSS inks deal to distribute the Tracker and Foamscan made by Teclis, France. Surface Tensiometer’s and Foam Analyzers in the North America.
PSS strikes up collaboration with Xigo to help sell the Surface Area Analyzer ACORN in North America.
PSS opens a Center of Excellence in Shanghi, China.
PSS’ Australian Distributor to be exhibiting at the International Conference on Nanosciences & Nanotechnology, February 5 – 9, Perth, Australia. BOOTH 22
March
Dr. David Fairhurst of Xigo Nanotools presents a poster on the use of NMR and the ACORN AREA a new and exciting technology for high concentration surface area measurements at the Pittsburg Conference in Orlando, Florida (Thursday afternoon session, POSTER 2590-4).
May
PSS’ China Distributor to be exhibiting at the 10th China International Scientific Instrument and Laboratory Equipment Exhibition (CISILE 2012, http://www.cisile.com.cn/en/) May 15-17, 2012 in Beijing, China
Presentations/Posters
January
PEPTALK, January 12-13, San Diego, California, USA Poster entited “Counting and Sizing Protein Aggregates down to 0.15 micron using new Focused Beam Light Scattering Technology” by David Nicoli, Patrick O’Hagan, and Kerry Hasapidis
March
Pittcon, March 15th, Orlando Florida USA Poster entitled “NMR as an Analytical Tool to Characterize the Behavior of Nano-particulate Dispersions” by David Fairhurst
May
NanoFormulation2012 Conference, Barcelona May 28 – June 1. Poster 83 entitled “Counting and Sizing Protein Aggregates Down to 0.15 Microns using New Focused Beam Light Scattering Technology” with Larry Unger